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타이틀아이콘제품소개

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In-situ TEM holders
Heating, Biasing, Gas, Liquid

Capture the dynamic structure change in-situ and understand the structure-property relationship. Expand your application space with our range of heating, biasing, gas and liquid.

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MEMS Technology

Replacing the copper grid sample carriers !

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ASTAR

TEM Phase & Orientation imaging

  • Use ASTAR to view EBSD-like data from your TEM or STEM.
  • Ultra-fast precession electron diffraction scanned acquisition.
  • Texture analysis & grain size morphology studies.
  • Spatial resolution < 2nm attainable
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TOPSPIN - AutoSTRAIN

TEM Strain Mapping Analysis

  • High spatial resolution / high precision strain mapping in TEM.
  • Ultrafast nanobeam precession diffraction scanned acquisition.
  • Automated local strain analysis.
  • Spatial resolution < 2nm attainable

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Advanced Nano Probing Tools

  • SEM 샘플의 전기적 역학적 특성 측정
  • EBIC, EBAC, Current Imaging 측정
  • Force Measurement
  • Gas, Liquid injection
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  • Nano Manipulation
  • In-situ AFM
  • 초소형 Heating stage
  • 초소형 sub-stage
  • Eucentric 5-axis stage

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Ultra sharp 5nm probe tip

  • Unpack and use directly
  • No tip cleaning & burn-in process
  • No coating material
  • 100% quality guaranty
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Sharpest Probe tip

  • 5, 10, 20, 35, 50, 100, 150nm
  • Probe for SEM based Nano probing system
  • Available on DCG, Hitachi, Kleindiek

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Evactron De Contaminator

  • Clean SEM, FIB for better imaging
  • Hydrocarbon removal in high vacuum chambers
  • Improve resolution contrast and scanning time
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Evactron SoftClean System

  • TEM, SEM, FIB sample cleaning
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Removal of Carbon contamination
from EUV Optics, XPS, TOF-SIMS